Worldwide
Worldwide
Device Modeling Using IC-CAP |  |
IC-CAP Device Modeling InformationDevice modeling consists of using Agilent EEsof EDA IC-CAP Parameter Extraction and Device Modeling Software to extract complete sets of nonlinear model parameters based on precision DC, CV, and S-parameter characterization. Measured data is used to extract device model parameters for use in circuit simulations, including simulations using SPICE tools and the Advanced Design System simulators. Industry-standard SPICE models as well as Agilent high-frequency models are available for Diode, MESFET, HEMT, BJT and MOSFET devices. RF and DC Parameter Measurement SolutionsRecommended Agilent IC-CAP Device Modeling Configurations enable both RF and DC device measurements. They include the RF and DC instruments, bias networks, cables and adapters necessary for accurately characterizing semiconductor devices. IC-CAP Device Modeling Configurations are compatible with Cascade Microtech and other probe stations for on-wafer measurement. The Agilent Performance Network Analyzer (PNA) is used to make RF measurements. The Agilent 4156 or E5720 semiconductor parameter analyzer is used to make DC measurements. The Agilent 11612T/V-Kxx High-Frequency Bias Networks provide a simple remote connection between the measurement system and the device under test for greater measurement accuracy. The DC connections are applied through force and sense triaxial connectors on the external bias networks that take advantage of the Kelvin sensing capability of the Agilent 4156C precision semiconductor parameter analyzer or the Agilent E5270B 8-slot parametric measurement mainframe with E5280B high power source/monitor unit and E5281B medium power source/monitor unit. This provides the highest DC accuracy while eliminating the need to use patch panels or adapter connectors. Optional Installation and Start-up AssistanceMeasurement hardware integration, installation, and start-up assistance are available as additional services. Please contact your Agilent EEsof EDA representative. Configuration InformationRecommended Modeling ConfigurationsListed below are various possible instrument configurations for device modeling using Agilent EEsof EDA IC-CAP Parameter Extraction and Device Modeling Software. Each configuration includes a performance network analyzer (PNA) for the chosen frequency range and bias networks for combining the DC and RF signals and making standard Kelvin measurements. The DC-subsystem includes the Agilent 4156C or E5270B DC source/monitor for highly precision DC measurements. Note that all of the Block Diagram and Setup files consist of more than one PowerPoint slide. To advance or go back within the slide set, click with the left-hand mouse button on the arrows in the bottom left-hand corner of each slide.
Instrument and Hardware Details
Pulsed CharacterizationAgilent Technologies recommends Auriga Measurement Systems for integrated pulsed-characterization systems. Agilent IC-CAP Parameter Extraction and Device Modeling Software can be integrated with Auriga test systems. The Auriga pulsed-bias/pulsed-RF solution replaces the discontinued Agilent 85124A Pulsed Modeling System. For assistance, please contact Agilent EEsof EDA technical support. Discontinuance of 8510-series Network Analyzers and Related ProductsAgilent 8510-series network analyzers and the Agilent 85124P DC Pulser have been discontinued effective 31 October 2003. Device modeling configurations that use these instruments will continue to be supported for five years, until 1 November 2008. For more information, click on the following link: Discontinuance of 8510-series Network Analyzers and Related Products Related ProductsUser SupportTraining ClassesIC-CAP User TrainingIn this three-day hands-on class, device modelers who need to understand the functions of the IC-CAP software learn how to define measurements and data and how to use basic analysis tools in IC-CAP. These tools include PEL (Parameter Extraction Language), built-in functions and extractions, simulation, and optimization. The class also shows how to automate modeling tasks with macros and how to use other simulators such as Advanced Design System (ADS) with IC-CAP. A measurement exercise familiarizes students with the steps involved in working with a measurement system. For detailed course descriptions and class schedules worldwide, click on the following link: Example FilesUser's Manuals |
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