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| ... Products & Services > Agilent EEsof EDA > Product Documentation > IC-CAP Documentation | |
| Information on known defects and workarounds, including errors and omissions in the documentation. | |
| Details on the requirements to install IC-CAP on PC and UNIX systems, step-by-step installation and configuration procedures, troubleshooting, and background information on the license manager software. | |
| Details on creating models, macros, and graphic user interfaces, making measurements, and using transforms and functions. Includes information on simulating, optimizing, programming, managing data, printing and plotting. | |
| Details on performing circuit modeling, using the 1/f noise extraction toolkit, and model characterization including information on model setup, instrument connections, and model parameters. | |
| Details on using IC-CAP with microwave and RF parameter extraction test systems, generating new device models, measuring devices, and extracting model parameters. | |
| Details on supported instruments, drivers, simulators, IC-CAP functions, Parameter Extraction Language (PEL), variables, and file structure. | |
| Details on using the IC-CAP Statistics package. Includes information on data analysis, data visualization, and file formats. | |
IC-CAP Modeling Reference |
Details on measurement, modeling and simulation of electronic components and circuits. ONLY AVAILABLE AT THE DOCUMENTATION WEBSITE. |
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Global Search of all IC-CAP documentation. |
Print Version of IC-CAP Documentation |
Links to PDF files for all IC-CAP documentation. |
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